Structural characterization of the ternary compound Cu3TaSe4

Journal of Alloys and Compounds

Volumn 439, Issue 1-2, 2007, Pages 346-349

  Delgado, Gerzon E ^a   Mora, Asiloé J ^a   Durán, Sonia ^a   Muñoz, Marcos ^a   Grima Gallardo, Pedro ^a  

^a FACULTAD DE CIENCIAS   (Venezuela)

Author keywords

Crystal structure; Inorganic materials; Semiconductors; X ray diffraction

Indexed keywords

COPPER COMPOUNDS; CRYSTAL STRUCTURE; CRYSTALLIZATION; RIETVELD METHOD; SEMICONDUCTOR MATERIALS; X RAY POWDER DIFFRACTION;

INORGANIC MATERIALS; SULVANITE MINERALS; THREE DIMENSIONAL ARRANGEMENT;

TERNARY SYSTEMS;

EID: 34248532646     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2006.08.232     Document Type: Article

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