Characterization of Y2SiO5:Ce thin films

Optical Materials

Volumn 29, Issue 11, 2007, Pages 1338-1343

  Coetsee, E ^a   Swart, H C ^a   Terblans, J J ^a   Ntwaeaborwa, O M ^a   Hillie, K T ^a,b   Jordaan, W A ^a,b   Buttner, U ^c  

^a UNIVERSITY OF THE FREE STATE   (South Africa)

^b CSIR National Metrology Laboratory   (South Africa)

^c STELLENBOSCH UNIVERSITY   (South Africa)

Author keywords

AFM; Cathodoluminescence; EDS; PLD; SEM; Thin films; XRD; Y2SiO5:Ce

Indexed keywords

ATOMIC FORCE MICROSCOPY; CATHODOLUMINESCENCE; FIELD EMISSION DISPLAYS; PHOSPHORS; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; SILICON; X RAY DIFFRACTION ANALYSIS; YTTRIUM ALLOYS;

BLUE EMISSION; COATED THIN FILM PHOSPHORS; PEAK VALUES;

THIN FILMS;

EID: 34248530577     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2006.06.009     Document Type: Article

References (19)

1. Sun X.W., and Kwok H.S. Appl. Phys. A, Mat. Sci. Proc. 69 (1999) 39
2. Swart H.C., Sebastian J.S., Trottier T.A., Jones S.L., and Holloway P.H. J. Vac. Sci. Technol. A 14 3 (1996) 1697
3. Holloway P.H., Sebastian J., Trottier T., Jones S., Swart H.C., and Peterson R.O. Mat. Res. Soc. Symp. Proc. 424 (1997) 425
4. Hillie K.T., and Swart H.C. Appl. Surf. Sci. 183 (2001) 304
5. Zhang Q.Y., Pita K., Buddhudu S., and Kam C.H. J. Phys. D: Appl. Phys. 35 (2002) 3085
6. Ollinger M., Cracium V., Nagore S., Senna M., and Singh R.K. ECS Lett. 9 3 (2006) G80
7. Hillie K.T., Curren C., and Swart H.C. Appl. Surf. Sci 177 (2001) 73
8. Li-Chyng C. Particulates generated by pulsed laser ablation. In: Chrisey D.B., and Hulber G.K. (Eds). Pulsed Laser Deposition of Thin Films (1994), John Wiley & Sons, Inc, New York 167
9. Shin S.H., Kang J.H., Jeon D.Y., and Zang D.S. J. Sol. State Chem. 178 (2005) 2205
10. Sebastian J.S., L Jones S., Trottier T., Swart H., and Holloway P. J. SID 3 4 (1995) 147
11. Fitz-Gerald J.M., Trottier T.A., Singh R.K., and Holloway P.H. Appl. Phys. Lett. 72 (1998) 1838
12. E.J. Bosze, G.A. Hirata, J. McKittrick, in: Princ, Mat. Proc, Symp. Mat. Res. Soc. Proc., San Francisco, CA, USA, 558 (1999) 15.
13. E. Coetsee, H.C. Swart, J.J. Terblans, J. Lumin., in press.
14. EDS, [online]. Available from (accessed 24.03.2006).
15. Wang J., Tian S., Li G., Liao F., and Jing X. J. Electrochem. Soc. 148 6 (2001) H61
16. Aitasalo T., Hölsä J., Lastusaari M., Legendziewicz J., Niittyykoski J., and Pellé F. Opt. Mater. 26 (2004) 107
17. Quyang X., Kitai A.H., and Siegele R. Thin Solid Films 254 (1995) 268
18. E.J. Bosze, G.A. Hirata, J. McKittrick, L.E. Shea, in: Mat. Res. Soc. Symp., San Francisco, CA, USA, 508 (1998) 269.
19. Holloway P.H., Trottier T.A., Abrams B., Kondoleon C., Jones S.L., Sebastian J.S., and Thomas W.J. J. Vac. Sci. Technol. B 17 2 (1999) 758