Pruning the volterra series for behavioral modeling of power amplifiers using physical knowledge

IEEE Transactions on Microwave Theory and Techniques

Volumn 55, Issue 5, 2007, Pages 813-820

  Zhu, Anding ^a,b   Pedro, José Carlos ^a,c   Cunha, Telmo Reis ^a,c  

^a IEEE   (Ireland)

^b UNIVERSITY COLLEGE DUBLIN   (Ireland)

^c UNIVERSITY OF AVEIRO   (Portugal)

Author keywords

Behavioral model; Power amplifiers (PAs); Volterra series

Indexed keywords

BEHAVIORAL MODELS; MICROWAVE POWER AMPLIFIERS; MODEL PRUNING TECHNIQUE;

BEHAVIORAL RESEARCH; COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; KNOWLEDGE ENGINEERING; MATHEMATICAL MODELS; MICROWAVES;

POWER AMPLIFIERS;

EID: 34248204184     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2007.895155     Document Type: Article

References (20)

1. M. Schetzen, The Volterra and Wiener Theories of Nonlinear Systems, reprint ed. Melbourne, FL: Krieger, 1989.
2. J. C. Pedro and S. A. Maas, "A comparative overview of microwave and wireless power-amplifier behavioral modeling approaches," IEEE Trans. Microw. Theory Tech., vol. 53, no. 4, pp. 1150-1163, Apr. 2005.
3. C. P. Silva et al., "Optimal-filter approach for nonlinear power amplifier modeling and equalization," in IEEE MTT-S Int. Microw. Symp. Dig., Boston, MA, Jun. 2000, pp. 437-440.
4. H. Ku, M. Mckinley, and J. S. Kenney, "Quantifying memory effects in RF power amplifiers," IEEE Trans. Microw. Theory Tech., vol. 50, no. 12, pp. 2843-2849, Dec. 2002.
5. J. Kim and K. Konstantinou, "Digital predistortion of wideband signals based on power amplifier model with memory," Electron. Lett., vol. 37, no. 23, pp. 1417-1418, Nov. 2001.
6. A. Zhu and T. J. Brazil, "Behavioral modeling of RF power amplifiers based on pruned Volterra series," IEEE Microw. Wireless Compon. Lett., vol. 14, pp. 563-565, Dec. 2004.
7. C. Silva, A. Moulthrop, and M. Muha, "Introduction to polyspectral modeling and compensation techniques for wideband communications systems," in 58th ARFTG Conf. Dig., San Diego, CA, Nov. 2001, pp. 1-15.
8. D. Mirri et al., "A nonlinear dynamic model for performance analysis of large-signal amplifiers in communication systems," IEEE Trans. Instrum. Meas., vol. 53, no. 2, pp. 341-350, Apr. 2004.
9. E. Ngoya et al., "Accurate RF and microwave system level modeling of wideband nonlinear circuits," in IEEE MTT-S Int. Micmw. Symp. Dig., Boston, MA, Jun. 2000, vol. 1, pp. 79-82.
10. A. Zhu, J. Dooley, and T. J. Brazil, "Simplified Volterra series based behavioral modeling of RF power amplifiers using deviation reduction," in IEEE MTT-S Int. Microw. Symp. Dig., 2006, pp. 1113-1116.
11. A. Zhu, J. C. Pedro, and T. J. Brazil, "Dynamic deviation reduction-based Volterra behavioral modeling of RF power amplifiers," IEEE Trans. Microw. Theory Tech., vol. 54, no. 12, pp. 4323-4332, Dec. 2006.
12. A. Zhu and T. J. Brazil, "RF power amplifiers behavioral modeling using Volterra expansion with Laguerre functions," in IEEE MTT-S Int. Microw. Symp. Dig., 2005, pp. 963-966.
13. M. Isaksson and D. Rönnow, "A Kautz-Volterra behavioral model for RF power amplifiers," in IEEE MTT-S Int. Microw. Symp. Dig., 2006, pp. 485-488.
14. J. C. Pedro, N. B. Carvalho, and P. M. Lavrador, "Modeling nonlinear behavior of bandpass memoryless and dynamic systems," in IEEE MTT-S Int. Microw. Symp. Dig., Philadelphia, PA, Jun. 2003, vol. 3, pp. 2133-2136.
15. E. Ngoya and A. Soury, "Envelope domain methods for behavioral modeling," in Fundamentals of Nonlinear Behavioral Modeling for RF and Microwave Design. Norwood, MA: Artech House, 2005, ch. 3, pp. 37-86.
16. J. C. Pedro and N. B. Carvalho, Intermodulation in Microwave and Wireless Circuits. Norwood, MA: Artech House, 2003.
17. J. Vuolevi, T. Rahkonen, and J. Manninen, "Measurement technique for characterizing memory effects in RF power amplifiers," IEEE Trans. Microw. Theory Tech., vol. 49, no. 8, pp. 1383-1389, Aug. 2001.
18. J. Vuolevi and T. Rahkonen, Distortion in RF Power Amplifiers, Norwood, MA: Artech House, 2003.
19. Advanced Design System (ADS) 2004A. Agilent Technol., Palo Alto, CA [Online]. Available: http://eesof.tm.agilent.com/
20. "Connected simulation and test solutions using the advanced design system," Agilent Technol., Palo Alto, CA, Applicat. Notes 1394, 2000.