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Volumn 1, Issue 2, 2007, Pages 117-125

Empirically-derived capacitor characteristic formulas from distributed modelling

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIELECTRIC LOSSES; ELECTRIC NETWORK TOPOLOGY; EQUIVALENT CIRCUITS; METALLIC FILMS; NATURAL FREQUENCIES;

EID: 34247874675     PISSN: 1751858X     EISSN: None     Source Type: Journal    
DOI: 10.1049/iet-cds:20060013     Document Type: Article
Times cited : (8)

References (16)
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  • 3
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    • Brown, R.W.1
  • 4
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    • 10.1109/6040.846648 1521-3323
    • Chen, K.Y., Brown, W.D., Schaper, L.W., Ang, S.S., and Naseem, H.A.: ' A study of the high frequency performance of thin film capacitors for electronic packaging ', IEEE Trans. Adv. Packag., 2000, 23, (2), p. 293-301 10.1109/6040.846648 1521-3323
    • (2000) IEEE Trans. Adv. Packag. , vol.23 , Issue.2 , pp. 293-301
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  • 5
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    • Siami, S., Joubert, C., and Glaize, C.: ' High frequency model for power electronic capacitors ', IEEE Trans. Power Electron., 2001, 16, (2), p. 157-166 0885-8993
    • (2001) IEEE Trans. Power Electron. , vol.16 , Issue.2 , pp. 157-166
    • Siami, S.1    Joubert, C.2    Glaize, C.3
  • 6
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    • Capacitor loss at radio frequencies
    • 10.1109/33.159890 0148-6411
    • Lafferty, R.E.: ' Capacitor loss at radio frequencies ', IEEE Trans. Compon. Hybrids Manuf. Technol., 1992, 15, (4), p. 590-593 10.1109/33.159890 0148-6411
    • (1992) IEEE Trans. Compon. Hybrids Manuf. Technol. , vol.15 , Issue.4 , pp. 590-593
    • Lafferty, R.E.1
  • 7
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    • An equivalent transmission-line model containing dispersion for high-speed digital lines-with an FDTD implementation
    • 0018-9375
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    • Smith, L.D.1    Hockanson, D.2
  • 9
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  • 11
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    • Distributed circuit modeling of capacitor parameters related to the metal film layer
    • accepted for publication
    • Brown, R.W.: ' Distributed circuit modeling of capacitor parameters related to the metal film layer ', IEEE Trans. Compon. Packag., accepted for publication
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  • 14
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    • accepted for publication
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.