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Volumn 40, Issue 5, 2007, Pages 405-418

High-frequency eddy current conductivity spectroscopy for residual stress profiling in surface-treated nickel-base superalloys

Author keywords

Eddy current; Residual stress; Shot peening; Spectroscopy

Indexed keywords

EDDY CURRENTS; ELECTRIC CONDUCTIVITY MEASUREMENT; NICKEL ALLOYS; NONDESTRUCTIVE EXAMINATION; PLASTIC DEFORMATION; RESIDUAL STRESSES; SHOT PEENING; SURFACE TREATMENT;

EID: 34247863828     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ndteint.2007.01.003     Document Type: Article
Times cited : (64)

References (29)
  • 1
    • 34247889193 scopus 로고    scopus 로고
    • Cammett JT, Prevéy PS, Jayaraman N. In: Proceedings of ICSP 9, Marne-la-Vallee, Paris, 2005.
  • 2
    • 34247850044 scopus 로고    scopus 로고
    • American Society for Metals, Metals Handbook, vol. 10. X-ray Diffraction Residual Stress Techniques, OH: Metals Park; 1986. p. 380-92.
  • 4
    • 34247878464 scopus 로고    scopus 로고
    • Prevéy PS. In: IITT-International. Gournay-Sur-Marne, France, 1990. p. 81-93.
  • 5
    • 34247899783 scopus 로고    scopus 로고
    • Hornbach DJ, Prevéy PS, Blodgett M. Review of progress in quantitative NDE, vol. 24. Melville, NY: American Institute of Physics; 2005. p. 1379-86.
  • 8
    • 34247859914 scopus 로고    scopus 로고
    • Goldfine N. In: 41st Army Sagamore conference. Plymouth, MA, 1994.
  • 9
    • 34247843653 scopus 로고    scopus 로고
    • Goldfine N, Clark D, Lovett T. In: EPRI topical workshop: electromagnetic NDE applications in the electric power industry. Charlotte, NC, 1995.
  • 11
    • 34247896336 scopus 로고    scopus 로고
    • Goldfine N, Clark D. In: EPRI balance of plant heat exchanger NDE symposium, Jackson, WY, 1996.
  • 13
    • 34247883495 scopus 로고    scopus 로고
    • A primer on the alternating current potential difference technique. Nepean, Ont.: Matelect Systems; 1999. p. 18-21.
  • 14
    • 34247854107 scopus 로고    scopus 로고
    • Lavrentyev I, Stucky PA, Veronesi WA. Review of progress in quantitative NDE, vol. 19. Melville, NY: American Institute of Physics; 2000. p. 1621-8.
  • 15
    • 34247865484 scopus 로고    scopus 로고
    • Fisher JM, Goldfine N, Zilberstein N. In: 49th defense working group on NDT. Biloxy, MS, 2000.
  • 16
    • 34247898489 scopus 로고    scopus 로고
    • Zilberstein V, Sheiretov Y, Washabaugh A, Chen Y, Goldfine NJ. Review of progress in quantitative NDE, vol. 20. Melville, NY: American Institute of Physics; 2001. p. 985-95.
  • 28
    • 34247859913 scopus 로고    scopus 로고
    • Agilent 4294A precision impedance analyzer operation manual. Palo Alto, CA: Agilent Technologies; 2003. p. 341-3.
  • 29
    • 34247851643 scopus 로고    scopus 로고
    • Milligan WW, Orth EL, Schirra JJ, Savage MF. Superalloys. Warrendale, PA: The Minerals, Metals and Materials Society; 2004, p. 331-9.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.