X-ray diffraction measurement of liquid As2Se3 by using third-generation synchrotron radiation

Journal of Non-Crystalline Solids

Volumn 353, Issue 18-21, 2007, Pages 1985-1989

  Kajihara, Y ^a   Inui, M ^a   Matsuda, K ^b   Tamura, K ^b   Hosokawa, S ^c  

^a HIROSHIMA UNIVERSITY   (Japan)

^b KYOTO UNIVERSITY   (Japan)

^c HIROSHIMA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Glass melting; Short range order; X ray diffraction

Indexed keywords

COMPUTER SIMULATION; DISTRIBUTION FUNCTIONS; MOLECULAR DYNAMICS; MOMENTUM TRANSFER; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

GLASS MELTING; SHORT-RANGE ORDER;

ARSENIC COMPOUNDS;

EID: 34247859242     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2007.01.062     Document Type: Article

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