XAFS study of six-coordinated silicon in R2O-SiO2-P2O5 (R = Li, Na, K) glasses

Journal of Non-Crystalline Solids

Volumn 353, Issue 18-21, 2007, Pages 1966-1969

  Ide, Junko ^a   Ozutsumi, Kazuhiko ^a   Kageyama, Hiroyuki ^b   Handa, Katsumi ^a   Umesaki, Norimasa ^c  

^a RITSUMEIKAN UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

Alkali silicates; Glasses; Oxide glasses; Phosphates; Short range order; Silicates; Structure; X ray absorption; X rays

Indexed keywords

ALKALI METAL COMPOUNDS; CONCENTRATION (PROCESS); GLASS; PHOSPHATES; SILICATES; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

ALKALI SILICATES; OXIDE GLASSES; SHORT-RANGE ORDER; X-RAY ABSORPTION;

SILICON;

EID: 34247844543     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2007.02.022     Document Type: Article

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