-
3
-
-
27344438720
-
Electrical conductivity measurement of metal plates using broadband eddy-current and four-point methods
-
Bowler, N. and Huang, Y. (2005) Electrical conductivity measurement of metal plates using broadband eddy-current and four-point methods. Meas. Sci. Technol., 16, p. 2193.
-
(2005)
Meas. Sci. Technol.
, vol.16
, pp. 2193
-
-
Bowler, N.1
Huang, Y.2
-
4
-
-
21644468888
-
Model-based characterization of homogeneous metal plates by four-point alternating current potential drop measurements
-
Bowler, N. and Huang, Y. (2005) Model-based characterization of homogeneous metal plates by four-point alternating current potential drop measurements. IEEE Trans. Magnetics, 41:6, p. 2102.
-
(2005)
IEEE Trans. Magnetics
, vol.41
, Issue.6
, pp. 2102
-
-
Bowler, N.1
Huang, Y.2
-
5
-
-
26444617185
-
Microscopic four-point atomic force microscope probe technique for local electrical conductivity measurement
-
Ju, B. F. and Saka, M. (2005) Microscopic four-point atomic force microscope probe technique for local electrical conductivity measurement. Rev. Sci. Instrum., 76:8, p. 86101.
-
(2005)
Rev. Sci. Instrum.
, vol.76
, Issue.8
, pp. 86101
-
-
Ju, B.F.1
Saka, M.2
-
7
-
-
0007942389
-
-
American Society for Testing and Materials, Philadelphia
-
Dover, W. D., Charlesworth, F. D. W., Taylor, K. A., Collins, R. and Michael, D. H. (1981) Eddy-current Characterization of Materials and Structures, p. 401. American Society for Testing and Materials, Philadelphia
-
(1981)
Eddy-current Characterization of Materials and Structures
, pp. 401
-
-
Dover, W.D.1
Charlesworth, F.D.W.2
Taylor, K.A.3
Collins, R.4
Michael, D.H.5
-
8
-
-
0001753683
-
Calibrating the electric potential method for studying slow crack growth
-
Johnson, H. H. (1965) Calibrating the electric potential method for studying slow crack growth. Mat. Res. Stand., 5:1, p. 442.
-
(1965)
Mat. Res. Stand.
, vol.5
, Issue.1
, pp. 442
-
-
Johnson, H.H.1
-
9
-
-
0032206790
-
NDE of a 3-D surface crack using closely coupled probes for DCPD technique
-
Saka, M., Hirota, D., Abé, H. and Komura, I. (1998) NDE of a 3-D surface crack using closely coupled probes for DCPD technique. J. Press. Vess. Technol., 120:4, p. 374.
-
(1998)
J. Press. Vess. Technol.
, vol.120
, Issue.4
, pp. 374
-
-
Saka, M.1
Hirota, D.2
Abé, H.3
Komura, I.4
-
10
-
-
0030145732
-
NDE of a crack by using closely coupled probes for DCPD technique
-
Saka, M., Oouchi, A. and Abé, H. (1996) NDE of a crack by using closely coupled probes for DCPD technique. J. Press. Vess. Technol., 118:2, p. 198.
-
(1996)
J. Press. Vess. Technol.
, vol.118
, Issue.2
, pp. 198
-
-
Saka, M.1
Oouchi, A.2
Abé, H.3
-
11
-
-
0033148472
-
Analysis of interaction of multiple cracks in a direct current field and nondestructive evaluation
-
Liu, H., Saka, M., Abé, H., Komura, I. and Sakamoto, H. (1999) Analysis of interaction of multiple cracks in a direct current field and nondestructive evaluation. J. Appl. Mech., 66:2, p. 468.
-
(1999)
J. Appl. Mech.
, vol.66
, Issue.2
, pp. 468
-
-
Liu, H.1
Saka, M.2
Abé, H.3
Komura, I.4
Sakamoto, H.5
-
12
-
-
0021662804
-
The interaction of ultrasound with contacting asperities: Applications to crack closure and fatigue crack growth
-
Buck, O., Thompson, R. B. and Rehbein, D. K. (1984) The interaction of ultrasound with contacting asperities: Applications to crack closure and fatigue crack growth. J. Nondestr. Eval., 4:34, p. 203.
-
(1984)
J. Nondestr. Eval.
, vol.4
, Issue.34
, pp. 203
-
-
Buck, O.1
Thompson, R.B.2
Rehbein, D.K.3
-
13
-
-
0002948055
-
A new approach to detect and size closed cracks by ultrasonics
-
Saka, M., Schneider, E. and Hoeller, P. (1989) A new approach to detect and size closed cracks by ultrasonics. Res. Nondestr. Eval., 1:2, p. 65.
-
(1989)
Res. Nondestr. Eval.
, vol.1
, Issue.2
, pp. 65
-
-
Saka, M.1
Schneider, E.2
Hoeller, P.3
-
14
-
-
0038808166
-
-
American Society for Testing and Materials, Philadelphia
-
Elber, W. (1971) Damage Tolerance in Aircraft Structures, p. 230. American Society for Testing and Materials, Philadelphia
-
(1971)
Damage Tolerance in Aircraft Structures
, pp. 230
-
-
Elber, W.1
-
15
-
-
0032208063
-
A sensitive ultrasonic approach to NDE of tightly closed small cracks
-
Ahmed, S. R. and Saka, M. (1998) A sensitive ultrasonic approach to NDE of tightly closed small cracks. J. Press. Vess. Technol., 120:4, p. 384.
-
(1998)
J. Press. Vess. Technol.
, vol.120
, Issue.4
, pp. 384
-
-
Ahmed, S.R.1
Saka, M.2
-
16
-
-
0036540021
-
Crack length independent evaluation of depth of small surface cracks
-
Ahmed, S. R. and Saka, M. (2002) Crack length independent evaluation of depth of small surface cracks. Mat. Eval., 60:4, p. 535.
-
(2002)
Mat. Eval.
, vol.60
, Issue.4
, pp. 535
-
-
Ahmed, S.R.1
Saka, M.2
-
17
-
-
0036523413
-
Influence of wall thickness on the ultrasonic evaluation of small closed surface cracks and quantitative NDE
-
Ahmed, S. R. and Saka, M. (2002) Influence of wall thickness on the ultrasonic evaluation of small closed surface cracks and quantitative NDE. J. Nondestr. Eval., 21:1, p. 9.
-
(2002)
J. Nondestr. Eval.
, vol.21
, Issue.1
, pp. 9
-
-
Ahmed, S.R.1
Saka, M.2
-
18
-
-
0023456005
-
The effect of crack closure on the reliability of NDT predictions of crack size
-
Clark, R. and Dover, W. D. (1987) The effect of crack closure on the reliability of NDT predictions of crack size. NDT International, 20:5, p. 269.
-
(1987)
NDT International
, vol.20
, Issue.5
, pp. 269
-
-
Clark, R.1
Dover, W.D.2
-
19
-
-
4644265795
-
Enhancement of sensitivity of the potential drop technique for sizing a crack by using closely coupled probes
-
New Delhi Oxford & IBH Publishing Co. Pvt. Ltd. Oxford & IBH Publishing Co. Pvt. Ltd
-
Saka, M., Hirota, D. and Abé, H. Enhancement of sensitivity of the potential drop technique for sizing a crack by using closely coupled probes. Proceedings of the 14th World Conference on NDT New Delhi Oxford & IBH Publishing Co. Pvt. Ltd., 3, p. 1659. Oxford & IBH Publishing Co. Pvt. Ltd.
-
Proceedings of the 14th World Conference on NDT
, vol.3
, pp. 1659
-
-
Saka, M.1
Hirota, D.2
Abé, H.3
-
20
-
-
11844306206
-
-
MSc Software Corporation, Santa Ana, CA
-
MSc Marc User's Guide, MSc Software Corporation, Santa Ana, CA
-
MSc Marc User's Guide
-
-
|