Nde of a crack by using closely coupled probes for dcpd technique

Journal of Pressure Vessel Technology, Transactions of the ASME

Volumn 118, Issue 2, 1996, Pages 198-202

  Saka, M ^a   Abe H ^a   Oouchi, A ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b XEROX CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; ELECTRIC CURRENT DISTRIBUTION; FRACTURE MECHANICS; INTEGRAL EQUATIONS; NONDESTRUCTIVE EXAMINATION; SENSITIVITY ANALYSIS;

CLOSELY COUPLED PROBES; DC POTENTIAL DROP TECHNIQUE; PATH INDEPENDENT INTEGRAL;

CRACKS;

EID: 0030145732     PISSN: 00949930     EISSN: 15288978     Source Type: Journal    
DOI: 10.1115/1.2842181     Document Type: Article

References (6)

1. Abé H., and Kanoh, Y, 1990, “An Inverse Problem in Nondestructive Inspection of a Crack in a Plate with an Inhomogeneity by Means of the Electrical Potential Method,” Micromechanics and Inhomogeneity, eds., G. J. Weng, M. Taya, and H. Ab6, Springer-Verlag, pp. 1-15.
2. Johnson, H. H., 1965, “Calibrating the Electric Potential Method for Studying Slow Crack Growth,” Materials Research and Standards, Vol. 5, No. 1.pp. 442-445.
3. Saka, M., and Abé H., 1983, “A Path-Independent Integral for 2-Dimensional Cracks In Homogeneous Isotropic Conductive Plate,” International Journal of Engineering Science, Vol. 21, No. 12, pp. 1451-1457.
4. Saka, M., and Abe, H., 1986, “Physical Interpretation of je-Integral for Two-Dimensional Cracks in a Homogeneous Isotropic Conductive Plate,” International Journal of Engineering Science, Vol. 24, No. 4, pp. 455-459.
5. Saka, M., and Abé H., 1992, “Path-Independent Integrals for Heat Conduction Analysis in Electrothermal Crack Problems,” Journal of Thermal Stresses, Vol. 15, No. 1, pp. 71-83.
6. Tada, H., Paris, P., and Irwin, G., 1973, The Stress Analysis of Cracks Handbook, Del Research Corp., Heilentown, PA, p. 224.