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Volumn 84, Issue 5-8, 2007, Pages 1806-1809

Study on the surface roughness of substrate with multi-fractal spectrum

Author keywords

AFM image; Fractal; Multi fractal spectrum; RMS; Surface roughness

Indexed keywords

ATOMIC FORCE MICROSCOPY; FRACTALS; RANDOM PROCESSES; SAMPLING; SPECTRUM ANALYSIS; SURFACE ROUGHNESS;

EID: 34247640699     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2007.01.273     Document Type: Article
Times cited : (21)

References (14)
  • 13
    • 34247576559 scopus 로고
    • Tsinghua University Press, Beijing
    • Zhang J.Z. Fractal [M] (1995), Tsinghua University Press, Beijing
    • (1995) Fractal [M]
    • Zhang, J.Z.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.