![]() |
Volumn 84, Issue 5-8, 2007, Pages 1806-1809
|
Study on the surface roughness of substrate with multi-fractal spectrum
|
Author keywords
AFM image; Fractal; Multi fractal spectrum; RMS; Surface roughness
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
FRACTALS;
RANDOM PROCESSES;
SAMPLING;
SPECTRUM ANALYSIS;
SURFACE ROUGHNESS;
AFM IMAGES;
MULTI FRACTAL SPECTRUM;
RANDOM SAMPLING;
SUBSTRATES;
|
EID: 34247640699
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mee.2007.01.273 Document Type: Article |
Times cited : (21)
|
References (14)
|