Composition profile of a wetting film in a binary mixture

Journal of Physical Chemistry C

Volumn 111, Issue 15, 2007, Pages 5568-5571

  Bowers, J ^a   Zarbakhsh, A ^b   McLure, I A ^c   Webster, J R P ^d   Steitz, R ^e   Christenson, H K ^f  

^a UNIVERSITY OF EXETER   (United Kingdom)

^b QUEEN MARY UNIVERSITY OF LONDON   (United Kingdom)

^c UNIVERSITY OF SHEFFIELD   (United Kingdom)

^d RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^e HAHN MEITNER INSTITUT   (Germany)

^f UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COATED MATERIALS; DENSITY (SPECIFIC GRAVITY); HEXANE; NEUTRON REFLECTION; VAN DER WAALS FORCES; WETTING;

BINARY LIQUID MIXTURES; NEUTRON REFLECTOMETRY; WETTING FILMS;

BINARY MIXTURES;

EID: 34247617245     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp0711951     Document Type: Article

References (29)

1. Bonn, D.; Ross, D. Rep. Prog. Phys. 2001, 64, 1085.
2. Law, B. D. Prog. Surf. Sci. 2001, 66, 159.
3. (a) Fisher, M. E.; De Gennes, P. G. C. R. Acad. Sci. (Paris) Ser. B 1978, 287, 207.
4. (b) Rowlinson, J. S.; Widom, B. Molecular Theory of Capillarity; Dover: Mineola, NY, 2002.
5. Zhao, H.; Penninckx-Sans, A.; Lee, L.-T.; Beysens, D.; Jannink, G. Phys. Rev. Lett. 1995, 75, 1977.
6. Cho, J.-H. J.; Law, B. M. Phys. Rev. Lett. 2001, 86, 2070.
7. Jestin, J.; Lee, L.-T.; Privat, M.; Zalczer, G. Eur. Phys. J. B 2001, 24, 541.
8. Fenistein, D.; Bonn, D.; Rafaï, S.; Wegdam, G. H.; Meunier, J.; Parry, A. O.; Telo da Gama, M. M. Phys. Rev. Lett. 2002, 89, 096101.
9. Cho, J.-H. J.; Law, B. M.; Gray, K. J. Chem. Phys. 2002, 116, 3058.
10. Bowers, J.; Zarbakhsh, A.; Christenson, H. K.; McLure, I. A.; Webster, J. R. P. Steitz, R. Phys. Rev. E 2005, 72, 041606.
11. Marschand, L. W.; Brown, M.; Lurio, L. B.; Law, B. M.; Uran, S.; Kuzmenko, I.; Gog, T. Phys. Rev. E 2005, 72, 011509.
12. Cahn, J. W. J. Chem. Phys. 1977, 66, 3667.
13. Liu, A. J.; Fisher, M. E. Phys. Rev. A 1989, 40, 7202.
14. Dietrich, S.; Napiorkowski, M. Phys. Rev. A 1991, 43, 1861.
15. Schmidt, J. W.; Moldover, M. R. J. Chem. Phys. 1985, 83, 1829.
16. Tostmann, H.; DiMasi, E.; Shpyrko, O. G.; Pershan, P. S.; Ocko, B. M.; Deutsch, M. Phys. Rev. Lett. 2000, 84, 4385.
17. (a) Plech, A.; Klemradt, U.; Peisl, J. Europhys. Lett. 2000, 49, 583.
18. (b) Plech, A.; Klemradt, U.; Peisl, J. J. Phys.: Condens. Matter 2001, 13, 5563.
19. (c) Plech, A.; Klemradt, U.; Aspelmeyer, M.; Huber, M.; Peisl, J. Phys. Rev. E 2002, 05, 061604.
20. Bowers, J.; Manzanares-Papayanopoulos, E.; McLure, I. A.; Cubitt, R. J. Phys. Condens. Matter 1998, 10, 8173.
21. Bowers, J.; Zarbakhsh, A.; Christenson, H. K.; McLure, I. A.; Cubitt, R. J. Chem. Phys. 2003, 119, 11917.
22. Bowers, J.; Zarbakhsh, A.; Querol, A.; Christenson, H. K.; McLure, I. A.; Cubitt, R. J. Chem. Phys. 2004, 121, 9058.
23. Telo da Gama, M. M.; Marini Bettolo Marconi, U. Physica A 1991, 171, 69.
24. Whitmer, J. K.; Kiselev, S. B.; Law, B. M. J. Chem. Phys. 2005, 123, 204720.
25. Kiselev, S. B.; Ely, J. F.; Belyakov, Yu, M. J. Chem. Phys. 2000, 112, 3370.
26. Braun, C. Parratt32 fitting routine for reflectivity data; Hahn-Meitner-Institut, Berlin, 1997-1999.
27. Parratt, L. G. Phys. Rev. 1954, 95, 359.
28. Sivia, D. S.; Hamilton, W. A.; Smith, G. S. Physica B 1991, 173, 121.
29. Kohonen, M. M.; Christenson, H. K. J. Phys. Chem. B 2002, 106, 6685.