A normalized Levenshtein distance metric

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 29, Issue 6, 2007, Pages 1091-1095

  Yujian, Li ^a,b   Bo, Liu ^a  

^a BEIJING UNIVERSITY OF TECHNOLOGY   (China)

^b Beijing Key Laboratory of Intelligent Telecommunications Software and Multimedia   (China)

Author keywords

AESA; Levenshtein distance; Metric; Normalized edit distance; Sequence comparison

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; DISTANCE MEASUREMENT; PATTERN MATCHING;

GENERALIZED LEVENSHTEIN DISTANCE; HANDWRITTEN DIGIT RECOGNITION; NORMALIZED EDIT DISTANCE; TRIANGLE INEQUALITY;

OBJECT RECOGNITION;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; COMPUTER ASSISTED DIAGNOSIS; EVALUATION; IMAGE ENHANCEMENT; INFORMATION RETRIEVAL; METHODOLOGY; STATISTICAL MODEL; THREE DIMENSIONAL IMAGING;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; INFORMATION STORAGE AND RETRIEVAL; MODELS, STATISTICAL; PATTERN RECOGNITION, AUTOMATED;

EID: 34247568980     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2007.1078     Document Type: Article

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