Recognition of Noisy Subsequences Using Constrained Edit Distances

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn PAMI-9, Issue 5, 1987, Pages 676-685

  Oommen, B John ^a  

^a CARLETON UNIVERSITY   (Canada)

Author keywords

Constrained editing; Levenshtein metric; String correction; subsequence correction; substring correction

Indexed keywords

EID: 0003051308     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.1987.4767962     Document Type: Article

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