Field emission to control tip-sample distance in magnetic probe recording

Journal of Physics: Conference Series

Volumn 61, Issue 1, 2007, Pages 673-677

  Le Febre A J ^a   Luttge, R ^a   Abelmann, L ^a   Lodder, J C ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34247513078     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/61/1/135     Document Type: Article

References (16)

1. Quate, C F 1986 US Patent 4,575,822
2. Mamin, H J, Rugar, D 1992 Appl. Phys. Lett. 61 1003
3. Eleftheriou, E et al 2003 IEEE Trans. Magn. 39 938
4. Craus, C B et al 2005 J Phys D 38 363
5. El-Sayed, R T, Carley, L R 2003 IEEE Trans Magn. 396 3566
6. Porthun, S, Abelmann, L, Lodder, J C 1998 J Magn Magn Mater 182 238
7. Elings, V, Gurley, J 1994 US Patent 5,308,974
8. Forbes, R G 1999 Ultramicroscopy 79 11
9. Young, R, Ward, J, Scire, F 1972 Rev. Sci. Instrum. 43 999
10. McCord, M A, Pease R F W 1987 J. Vac. Sci. Technol. B 5 430
11. Marrian, R K, Dobisz, E A, Colton, R J, J Vac 1990 Sci. Technol. A 8 3563
12. Wilder, K et al 1998 Appl. Phys. Lett. 73 2527
13. Moreland, J, Rice, P 1990 Appl. Phys. Lett. 57 310
14. Onoue, T et al 2005 J Magn Magn Mater 287 501
15. Zhang, L et al 2006 J Appl Phys 99 023902
16. Murillo R, et al 2005 Micr. Eng. 78-79 260