Using atomic force microscopy to reveal the nature of extended defects in organic semiconductors: The role of crystal growth mechanisms

Journal of Physics: Conference Series

Volumn 61, Issue 1, 2007, Pages 831-835

  Moret, M ^a   Campione, M ^a   Caprioli, S ^a   Raimondo, L ^a   Sassella, A ^a   Tavazzi, S ^a   Aquilano, D ^b  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

^b UNIVERSITY OF TURIN   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34247478128     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/61/1/166     Document Type: Article

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