Long-term stability of the NIST chip-scale atomic clock physics packages

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6466, Issue , 2007, Pages

  Knappe, S ^a   Gerginov, V ^b   Shah, V ^c   Brannon, A ^d   Hollberg, L ^a   Kitching, J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF NOTRE DAME   (United States)

^c UNIVERSITY OF COLORADO   (United States)

^d University of Colorado at Boulder   (United States)

Author keywords

Atomic clock; Coherent population trapping; CPT; CSAC; MEMS; Microfabrication

Indexed keywords

COHERENT POPULATION TRAPPING; CSAC; VACUUM SEALING;

FREQUENCY STABILITY; INTEGRATED CIRCUITS; MEMS; MICROFABRICATION; PORTABLE EQUIPMENT; TEMPERATURE CONTROL;

ATOMIC CLOCKS;

EID: 34247373150     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.701591     Document Type: Conference Paper

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