Bulk and interface properties of (Zn,Mg)O buffer layers sputtered in hydrogen-containing atmosphere

Thin Solid Films

Volumn 515, Issue 15 SPEC. ISS., 2007, Pages 6073-6075

  Grimm, A ^a   Klenk, R ^b   Lux Steiner, M Ch ^a,b   Visbeck, S ^c  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

^c SHELL GLOBAL SOLUTIONS INTERNATIONAL B V   (United States)

Author keywords

Chalcopyrite; Heterojunction; Thin film; Transparent conductive oxide (TCO)

Indexed keywords

ELECTROSTATICS; HETEROJUNCTIONS; INTERFACES (MATERIALS); REDOX REACTIONS; SOLAR CELLS; THIN FILMS;

CHALCOPYRITE; HYDROGEN FLOW; TRANSPARENT CONDUCTIVE OXIDE (TCO);

BUFFER LAYERS;

EID: 34247351093     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.12.135     Document Type: Article

References (6)

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