Ellipsometric study of liquid crystal infiltrated porous silicon

Molecular Crystals and Liquid Crystals

Volumn 465, Issue 1, 2007, Pages 359-370

  Marino, A ^a,d   Abbate, G ^a,b   Tkachenko, V ^a   Rea, I ^a,c   De Stefano, L ^c   Giocondo, M ^b  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b UNIVERSITY OF CALABRIA   (Italy)

^c CNR IMM   (Italy)

^d Dipartimento di Scienze Fisiche   (Italy)

Author keywords

Anisotropy; Ellipsometry; Liquid crystal; Porous silicon; Refractive index

Indexed keywords

ANISOTROPY; ELLIPSOMETRY; INFILTRATION; OPTICAL FILTERS; POROUS SILICON; REFRACTIVE INDEX;

HETEROGENEOUS COMPOSITES; ISOTROPIC TRANSITION; VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY (VASE);

LIQUID CRYSTALS;

EID: 34247345397     PISSN: 15421406     EISSN: 15635287     Source Type: Journal    
DOI: 10.1080/15421400701206220     Document Type: Conference Paper

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