Simulation of electrical resistivity of carbon black filled rubber under elongation

Journal of Macromolecular Science, Part B: Physics

Volumn 46 B, Issue 3, 2007, Pages 561-567

  Xie, Zhimin ^a,b   Yum, Young Jin ^b   Lee, Chul Kyoung ^b  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

^b University of Ulsan   (South Korea)

Author keywords

Carbon black network; Circuit; Filled rubber; Resistivity; Simulation; Tunneling conduction mechanism

Indexed keywords

CARBON BLACK; COMPUTER SIMULATION; CONTACT RESISTANCE; ELASTICITY; ELECTRIC CONDUCTIVITY; STRAIN; VOLUME FRACTION;

CARBON BLACK NETWORK; FILLED RUBBER; TUNNELING CONDUCTION MECHANISM;

RUBBER;

EID: 34247342853     PISSN: 00222348     EISSN: 1525609X     Source Type: Journal    
DOI: 10.1080/00222340701257893     Document Type: Article

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