The analysis of current flow mechanism in CdS/CdTe heterojunction

Thin Solid Films

Volumn 515, Issue 15 SPEC. ISS., 2007, Pages 6179-6183

  Vatavu, Sergiu ^a   GaŞin, Petru ^a  

^a MOLDOVA STATE UNIVERSITY   (Moldova)

Author keywords

CdS CdTe; Current flow mechanism; Heterojunction

Indexed keywords

ANNEALING; CONCENTRATION (PROCESS); CURRENT VOLTAGE CHARACTERISTICS; DISLOCATIONS (CRYSTALS); ELECTRON TUNNELING; THERMAL EFFECTS;

CHARACTERISTIC ENERGY; CURRENT FLOW MECHANISM; IMPURITY CENTRES;

HETEROJUNCTIONS;

EID: 34247339606     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.12.086     Document Type: Article

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