ICP-MS: When sensitivity does matter

LCGC North America

Volumn 25, Issue 4 SUPPL., 2007, Pages 36-43

  Elliott, Shane ^a   Sturman, Barry ^a   Anderson, Stephen ^a   Brouwers, Elke ^b   Beijnen, Jos ^b  

^a Varian Australia   (Australia)

^b SLOTERVAART HOSPITAL   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34247332738     PISSN: 15275949     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)

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2. E. Denoyer, Atom. Spectroscopy 13, 93-98 (1992).
3. J.D. Ingle, Jr. and S.R. Crouch, in Spectrochemical Analysis (Prentice-Hall, Englewood Cliffs, New Jersey, 1988), chapter 5 and pp. 245-246.
4. DA Sadler, D. Littlejohn, and C.V. Perkins, J. Anal. Atom. Spectrom. 11, 207-212 (1996).
5. I. Kalinitchenko, Ion Optical System for a Mass Spectrometer, United States Patent Number 6,614,021 B1 (2003).
6. I. Kalinitchenko, "A New ICP-MS System," Winter Conference on Plasma Spectrochemistry, Frankfurt, Germany (2003).
7. S. Elliott, M. Knowles, and I. Kalinitchenko, American Laboratory, 24-29 (March, 2004)
8. E.E.M. Brouwers, M.M. Tibben, H. Rosing, M.J.X. Hillebrand, M. Joerger, J.H.M. Schellens, and J.H. Beijnen, J. Mass Spectrom. 41, 1186-1194 (2006).