Use of signal-to-root background ratio as the optimization parameter for inductively coupled plasma atomic emission spectroscopy with charged-coupled device detection

Journal of Analytical Atomic Spectrometry

Volumn 11, Issue 3, 1996, Pages 207-212

  Sadler, D A ^a   Littlejohn, D ^a   Perkins, C V ^b  

^a UNIVERSITY OF STRATHCLYDE   (United Kingdom)

^b Unicam Analytical Ltd   (United Kingdom)

Author keywords

Charge coupled device; Inductively coupled plasma atomic emission spectrometry; Optimization; Signal to root background ratio

Indexed keywords

EID: 0001444388     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/ja9961100207     Document Type: Article

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