Reentrant high-conduction state in CuIr2S4 under pressure

Solid State Communications

Volumn 142, Issue 7, 2007, Pages 369-372

  Garg, Alka B ^a   Vijayakumar, V ^a   Godwal, B K ^b   Choudhury, A ^c   Hochheimer, Hans D ^c  

^a BHABHA ATOMIC RESEARCH CENTRE   (India)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c Veterinary Dentistry and Oral Surgery   (United States)

Author keywords

A. Inorganic compounds; B. X ray diffraction; C. Electric transport; D. High pressure

Indexed keywords

CONDUCTION BANDS; CORRELATION METHODS; ELECTRIC RESISTANCE; PRESSURE EFFECTS; X RAY DIFFRACTION ANALYSIS;

ANGLE DISPERSIVE X-RAY DIFFRACTION MEASUREMENTS; CHALCOGENIDE SPINEL; CONDUCTING PHASE;

COPPER COMPOUNDS;

EID: 34247248757     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2007.03.029     Document Type: Article

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