Digital isolation amplifier in silicon-on-sapphire CMOS

Electronics Letters

Volumn 43, Issue 8, 2007, Pages 451-452

  Culurciello, E ^a   Pouliquen, P O ^b   Andreou, A G ^b  

^a Yale University   (United States)

^b Johns Hopkins University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ERROR ANALYSIS; FAULT TOLERANCE; PHASE SHIFT KEYING; SILICON ON INSULATOR TECHNOLOGY;

DIGITAL ISOLATION AMPLIFIERS; ISOLATION CHANNELS; SAPPHIRE SUBSTRATES;

AMPLIFIERS (ELECTRONIC);

EID: 34247221087     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20070509     Document Type: Article

References (8)

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