Metric-based upscaling

Communications on Pure and Applied Mathematics

Volumn 60, Issue 5, 2007, Pages 675-723

  Owhadi, Houman ^a   Zhang, Lei ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34247218601     PISSN: 00103640     EISSN: 00103640     Source Type: Journal    
DOI: 10.1002/cpa.20163     Document Type: Article

References (78)

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