Influence of thin metal base thickness on the performance of CuPc vertical organic triodes

Applied Physics Letters

Volumn 90, Issue 15, 2007, Pages

  Cheng, Shiau Shin ^a   Yang, Chuan Yi ^a   Chuang, You Che ^a   Ou, Chun Wei ^a   Wu, Meng Chyi ^a   Lin, Shin Yen ^b,c   Chan, Yi Jen ^d  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b RESEARCH CENTER FOR APPLIED SCIENCES   (Taiwan)

^c NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^d INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; FILM THICKNESS; METALLIC FILMS; SCHOTTKY BARRIER DIODES; THIN FILMS;

COMMON EMITTER CURRENT GAIN; ORGANIC TRIODES; PHTHALOCYANINE; RECOMBINATION CURRENT;

TRIODES;

EID: 34247213452     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2722623     Document Type: Article

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