Measurement and estimation of temperature rise in TEM sample during ion milling

Ultramicroscopy

Volumn 107, Issue 8, 2007, Pages 663-668

  Park, Young Min ^a   Ko, Dong Su ^a   Yi, Kyung Woo ^a   Petrov, Ivan ^b   Kim, Young Woon ^a  

^a Seoul National University   (South Korea)

^b University of Illinois at Urbana Champaign   (United States)

Author keywords

Ion milling; TEM sample preparation; Temperature

Indexed keywords

COATING TECHNIQUES; PARAMETER ESTIMATION; THERMAL CONDUCTIVITY; THERMAL LOAD; THERMOCOUPLES; TRANSMISSION ELECTRON MICROSCOPY;

INCIDENT ANGLE; ION MILLING; POLYMER COATINGS; TEM SAMPLE PREPARATION;

TEMPERATURE MEASUREMENT;

ARTICLE; CRYSTALLIZATION; HEAT; ION TRANSPORT; MATHEMATICAL COMPUTING; MOLECULAR PROBE; TEMPERATURE MEASUREMENT; THERMAL CONDUCTIVITY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 34247173511     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.01.002     Document Type: Article

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