Electrical capacitance volume tomography with high contrast dielectrics using a cuboid sensor geometry

Measurement Science and Technology

Volumn 18, Issue 5, 2007, Pages 1511-1520

  Nurge, Mark A ^a  

^a KENNEDY SPACE CENTER   (United States)

Author keywords

Electrical capacitance tomography; Electrical capacitance volume tomography; High contrast dielectrics; Image reconstruction; Inverse problem; Iterative algorithm; Self capacitance

Indexed keywords

ALGORITHMS; DIELECTRIC MATERIALS; IMAGE RECONSTRUCTION; INVERSE PROBLEMS; MEASUREMENT THEORY; SENSORS;

ELECTRICAL CAPACITANCE TOMOGRAPHY; ELECTRICAL CAPACITANCE VOLUME TOMOGRAPHY; HIGH CONTRAST DIELECTRICS; ITERATIVE ALGORITHM;

TOMOGRAPHY;

ALGORITHMS; DIELECTRIC MATERIALS; IMAGE RECONSTRUCTION; INVERSE PROBLEMS; MEASUREMENT THEORY; SENSORS; TOMOGRAPHY;

EID: 34247135062     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/18/5/042     Document Type: Article

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