Single crystal bulk material micro/nano indentation hardness testing by nanoindentation instrument and AFM

Materials Science and Engineering: A

Volumn 460-461, Issue , 2007, Pages 95-100

  Zhou, Liang ^a   Yao, Yingxue ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Atomic force microscopy; Hardness; Nanoindentation; Oliver Pharr method; Work of indentation method

Indexed keywords

ALUMINUM; ATOMIC FORCE MICROSCOPY; CURVE FITTING; HARDNESS; HARDNESS TESTING; NANOINDENTATION; POLYNOMIALS; SILICON;

INDENTATION METHOD; OLIVER-PHARR METHOD; SINGLE CRYSTAL ALUMINUM; SINGLE CRYSTAL SILICON;

SINGLE CRYSTALS;

ALUMINUM; ATOMIC FORCE MICROSCOPY; CURVE FITTING; HARDNESS; HARDNESS TESTING; NANOINDENTATION; POLYNOMIALS; SILICON; SINGLE CRYSTALS;

EID: 34247134558     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2007.01.029     Document Type: Article

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