Layer-by-layer growth of thin epitaxial Fe3Si films on GaAs (001)

Thin Solid Films

Volumn 515, Issue 14 SPEC. ISS., 2007, Pages 5611-5614

  Jenichen, B ^a   Kaganer, V M ^a   Braun, W ^a   Herfort, J ^a   Shayduk, R ^a   Ploog, K H ^a  

^a PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

Author keywords

Ferromagnetic materials; MBE; Surface topography; X ray diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; FERROMAGNETIC MATERIALS; FILM GROWTH; IRON COMPOUNDS; MOLECULAR BEAM EPITAXY; SEMICONDUCTING GALLIUM ARSENIDE; SURFACE TOPOGRAPHY; X RAY DIFFRACTION;

ATOMIC FORCE MICROGRAPHS; GRAZING INCIDENCE X-RAY DIFFRACTION; SUBSTRATE TEMPERATURES; X-RAY OSCILLATIONS;

EPITAXIAL FILMS;

EID: 34247093321     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.12.119     Document Type: Article

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