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Volumn 156, Issue 1-3, 1996, Pages 411-412
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Study of self-diffusion in crystalline and amorphous multilayer samples by neutron reflectometry
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS MATERIALS;
ANNEALING;
CRYSTALLINE MATERIALS;
GRAIN BOUNDARIES;
MULTILAYERS;
NEUTRON SOURCES;
NICKEL;
NICKEL ALLOYS;
POLYCRYSTALLINE MATERIALS;
REFLECTOMETERS;
AMORPHOUS MULTILAYERS;
CRYSTALLINE MULTILAYERS;
GRAIN BOUNDARY DIFFUSION;
NEUTRON REFLECTOMETRY;
SELF DIFFUSION;
DIFFUSION;
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EID: 0030125132
PISSN: 03048853
EISSN: None
Source Type: Journal
DOI: 10.1016/0304-8853(95)00918-3 Document Type: Article |
Times cited : (41)
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References (2)
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