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Volumn 156, Issue 1-3, 1996, Pages 411-412

Study of self-diffusion in crystalline and amorphous multilayer samples by neutron reflectometry

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ANNEALING; CRYSTALLINE MATERIALS; GRAIN BOUNDARIES; MULTILAYERS; NEUTRON SOURCES; NICKEL; NICKEL ALLOYS; POLYCRYSTALLINE MATERIALS; REFLECTOMETERS;

EID: 0030125132     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-8853(95)00918-3     Document Type: Article
Times cited : (41)

References (2)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.