Surface morphology of spin-coated As-S-Se chalcogenide thin films

Journal of Non-Crystalline Solids

Volumn 353, Issue 13-15 SPEC. ISS., 2007, Pages 1437-1440

  Kohoutek, T ^a   Wagner, T ^a   Orava, J ^a   Krbal, M ^a   Fejfar, A ^b   Mates, T ^b   Kasap, S O ^c   Frumar, M ^a  

^a UNIVERSITY OF PARDUBICE   (Czech Republic)

^b INSTITUTE OF MATHEMATICS   (Czech Republic)

^c UNIVERSITY OF SASKATCHEWAN   (Canada)

Author keywords

Atomic force and scanning tunneling microscopy; Chalcogenides; Chemical properties; Defects; Infrared glasses; Nanoparticles; Scanning electron microscopy; Spin coating; Structure

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHALCOGENIDES; NANOPARTICLES; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SPIN COATING; SURFACE MORPHOLOGY; SURFACE ROUGHNESS;

BUTYLAMINE SOLUTIONS; INFRARED GLASSES; ROOT MEAN SQUARE; ROUGHNESS ANALYSIS;

THIN FILMS;

EID: 34147166993     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2006.10.068     Document Type: Article

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