Yield stress strengthening in ultrafine-grained metals: A two-dimensional simulation of dislocation dynamics

Journal of the Mechanics and Physics of Solids

Volumn 55, Issue 4, 2007, Pages 788-802

  Lefebvre, S ^a,b   Devincre, B ^c   Hoc, T ^a  

^a ECOLE CENTRALE PARIS   (France)

^b Altis Semiconductor   (France)

^c CNRS   (France)

Author keywords

Dislocation dynamics; Plastic deformation; Semiconductor material; Simulation; Size effects

Indexed keywords

DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; PLASTIC DEFORMATION; SEMICONDUCTOR MATERIALS; STRESS CONCENTRATION; TWO DIMENSIONAL; YIELD STRESS;

DISLOCATION DYNAMICS; HALL-PETCH LAWS; SIZE EFFECTS; TWO-DIMENSIONAL SIMULATION; ULTRAFINE-GRAINED METALS;

STRENGTHENING (METAL);

EID: 34147165631     PISSN: 00225096     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmps.2006.10.002     Document Type: Article

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