High-frequency modeling of frequency-dependent dielectric and conductor losses in transmission lines

IEEE Transactions on Components and Packaging Technologies

Volumn 30, Issue 1, 2007, Pages 86-91

  Chan, Jason E ^a,b   Sivaprasad, Kondagunta ^a   Chamberlin, Kent A ^a  

^a University of New Hampshire   (United States)

^b Teradyne Connection Systems   (United States)

Author keywords

Broadband; Frequency dependent; Loss tangent; Modeling; Stripline

Indexed keywords

DIELECTRIC LOSSES; ELECTRIC CONDUCTORS; MATHEMATICAL MODELS; MOISTURE DETERMINATION; SURFACE ROUGHNESS;

CONDUCTIVE LOSSES; FREQUENCY DEPENDENT; HIGH-FREQUENCY MODELING; STRIPLINE;

ELECTRIC LINES;

EID: 34147157681     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAPT.2007.892077     Document Type: Article

References (19)

1. R. E. Collin, Foundations for Microwave Engineering - Second Edition New York: IEEE Press, 2001, pp. 170-172.
2. J. R. Reitz, F. J. Milford, and R. W. Christy, Foundations of Electromagnetic Theory. Reading, MA: Addison-Wesley, 1979, pp. 422-449.
3. S. Khan, "Comparison of the Dielectric Constant and Dissipation Factors of Non-Woven Aramid/FR4 and Glass/FR4 Laminates," Tech. Rep., DuPont Advanced Fibers Systems, Richmond, VA, 1999.
4. Moisture Absorption, Flexible Printed Wiring, IPC-TM-650 Method 2.6.2, The Institute for Interconnecting and Packaging Electronic Circuits, 2006.
5. Merix Corp., "Technical Brief - Electrodeposited vs. Rolled Copper," Tech. Rep., Forest Grove, OR, 1997.
6. Rogers Corp., "Copper Foils for Microwave Circuits," Tech. Rep., Chandler, AZ, 2000.
7. K. E. G. Pitt et al., "The influence of materials properties on the design of MCM and microstrip structures," J. Mater. Sci.: Mater. Electron., vol. 10, pp. 519-524, 1999.
8. M. H. Burchett and S. R. Pennock, "A rigorous analysis of uniform stripline of arbitrary dimensions," IEEE Trans. Microw. Theory Tech. vol. 41, no. 12, pp. 2074-2080, Dec. 1993.
9. S. Ramo, J. R. Whinnery, and T. Van Duzer, Fields and Waves in Communication Electronics, 3rd ed. New York: Wiley, 1984, pp. 245-246.
10. R. Marks, "A multiline method of network analyzer calibration," IEEE Trans. Microw. Theory Tech., vol. MTT-39, no. 7, pp. 1205-1215, Jul. 1991.
11. K. J. Bois and B. Kirk et al., "Simple and accurate determination of complex permittivity and skin effect of FR4 material in gigahertz regime," in Proc. Electron. Comp. Technol. Conf., 2003, pp. 1277-1282.
12. J. B. Birks, Progress in Dielectrics - Vol. 7. Cleveland, OH: CRC Press, 1967, pp. 71-110.
13. Permittivity and Loss Tangent, Parallel Plate, 1 MHz to 1.5 GHz, IPC-TM-650 Method 2.5.5.9, The Institute for Interconnecting and Packaging Electronic Circuits, Nov. 1999.
14. Stripline Test for Permittivity and Loss Tangent (Dielectric Constant and Dissipation Factor) at X-Band, IPC-TM-650 Method 2.5.5.5, The Institute for Interconnecting and Packaging Electronic Circuits, Nov. 1999.
15. Stripline Test for Complex Relative Permittivity of Circuit Board Materials to 14 GHz, IPC-TM-650 Method 2.5.5.5.1, The Institute for Interconnecting and Packaging Electronic Circuits, Nov. 1999.
16. R. W. P. King and G. S. Smith, Antennas in Matter: Fundamentals, Theory, and Applications. Cambridge, MA: The MIT Press, 1981, pp. 391-413.
17. A. R. Djordjevic et al., "Wideband frequency-domain characterization of FR-4 and time-domain causality," IEEE Trans. Electromagn. Compat. vol. 43, no. 4, pp. 662-667, Nov. 2001.
18. R. J. Luebbers, The Finite Difference Time Domain Method for Electromagnetics. Boca Raton, FL: CRC Press, 1993, p. 124.
19. S. P. Morgan, "Effect of surface roughness on eddy current losses at microwave frequencies," J. Appl. Phys., vol. 20, pp. 352-359, Apr. 1949.