Simple and accurate determination of complex permittivity and skin effect of FR4 material in Gigahertz regime

Proceedings - Electronic Components and Technology Conference

Volumn , Issue , 2003, Pages 1277-1282

  Bois, Karl J ^a   Kirk, Brian ^a   Tsuk, Michael ^a   Quint, David ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC LOSSES; DIELECTRIC PROPERTIES; ELECTRIC CONDUCTORS; ETCHING; PERMITTIVITY; PRINTED CIRCUIT BOARDS; SCATTERING; SKIN EFFECT;

COMPLEX PERMITTIVITY; CONDUCTOR LOSSES; GIGAHERTZ REGIME;

ELECTRONIC EQUIPMENT;

EID: 0038688835     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

1. Nicholson, A.M., and G. Ross, "Measurement of intrinsic properties of materials by time domain techniques," IEEE Transactions on Instrumentation and Measurements, vol. 19, pp. 377-382, November 1970.
2. Baker-Jarvis, J., E.J. Vanzura, and W.A. Kissck, "Improved Technique for Determining Complex Permittivity with Transmission/Reflection Method," IEEE Transactions on Microwave Theory and Techniques, vol. 38, pp. 1096-1103, August 1990.
3. Bois, K.J., L.F. Handjojo, A.D. Benally, K. Mubarak, and R. Zoughi, "Dielectric Plug-Loaded Two-Port Transmission Line Measurement Technique for Dielectric Property Characterization of Granular or Liquid Materials," IEEE Transactions on Intrumentation and Measurements, vol. 48, no. 6, pp. 1141-1148, December 1999.
4. Janezic, M.D., J.A. Jargon, "Complex Permittivity Determination from Propagation Constant Measurements," IEEE Microwave and Guided Letters, vol. 9, no. 2 (1999), pp. 76-78.
5. Marks, R., "A Multiline Method of Network Analyzer Calibration," IEEE Transactions on Microwave Theory and Techniques, vol. 39, no. 7 (1991), 1205-1215.
6. DeGroot, D., D. Walter, and R. Marks, "Impedance Mismatch Effects on Propagation Constant Measurements," IEEE 5th Topical Meeting on Electrical Performance of Electronical Packaging, Napa, CA, Oct. 1996.
7. Reynoso-Hernández, "Reliable Method for Computing the Phase Shift of Multiline LRL Calibration Technique," IEEE Microwave and Wireless Components Letters, vol 12, no. 10, 99. 395-397, October 2002
8. Antonini, G., A. Orlandi, and C. R. Paul, "Internal Impedance of Conductors of Rectangular Cross Section," IEEE Transactions on Microwave Theory and Techniques, vol. 47, no. 7 (1999), pp. 979-985.
9. Arabi, T.R., A. T. Murphy, T. K. Sarkar, R. F. Harrington, A. R. Djordjevic, "On the Modeling of Conductor and Substrate Losses in Multiconductor, Multidielectric Transmission Line Systems," IEEE Transactions on Microwave Theory and Techniques, vol. 39, no. 7 (1991) pp. 1090-1097.
10. Djordjevic, A.R., R. M. Biljic, V. D. Likar-Smiljanic, T. K. Sarkar, "Wideband Frequency-Domain Characterization of FR-4 and Time-Domain Causality," IEEE Transactions on Electromagnetic Compatibility, vol. 43, no. 4 (2001) pp. 662-667
11. Ruehli, A. E., A. C. Cangellaris, H.-M. Huang, "Three Test Problems for the Comparison of Lossy Transmission Line Algorithms," IEEE 11th Topical Meeting on Electrical Performance of Electronical Packaging, Monterey, CA, October 2002.
12. Ramo, S. et al., Fields and Waves in Communication electronics, 2nd Edition, John Wiley and Sons (New York, 1984), p. 671.