Field localization and enhanced Second-Harmonic Generation in silicon-based microcavities

Optics Express

Volumn 15, Issue 7, 2007, Pages 4159-4167

  Descrovi, E ^a   Ricciardi, C ^a   Giorgis, F ^a   Lerondel G ^b   Blaize, S ^b   Pang, C X ^b   Bachelot, R ^b   Royer, P ^b   Lettieri, S ^c   Gesuele, F ^c   Maddalena, P ^c   Liscidini, M ^d  

^a POLITECNICO DI TORINO   (Italy)

^b UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

^c UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^d UNIVERSITY OF PAVIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ELECTRIC FIELDS; FABRY-PEROT INTERFEROMETERS; HARMONIC GENERATION; MATHEMATICAL MODELS; NATURAL FREQUENCIES; SILICON; SILICON NITRIDE;

FIELD LOCALIZATION; LINEAR REFLECTANCE; PLANAR MICROCAVITIES;

MICROCAVITIES;

EID: 34147117968     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.004159     Document Type: Article

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