AC behavior of intrinsic nanocrystalline diamond films

Diamond and Related Materials

Volumn 16, Issue 4-7 SPEC. ISS., 2007, Pages 935-939

  Giorgi, L ^a   Giorgi, R ^a   Gianoglio, S ^a   Lisi, N ^a   Feliciangeli, M C ^b   Rossi, M C ^b   Conte, G ^b  

^a ENEA   (Italy)

^b ROMA TRE UNIVERSITY   (Italy)

Author keywords

AC measurements; Admittance spectroscopy; Grain boundary; Nanocrystalline diamond

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ELECTRIC ADMITTANCE; ELECTRIC VARIABLES MEASUREMENT; GRAIN BOUNDARIES; NANOCRYSTALLINE MATERIALS;

ADMITTANCE SPECTROSCOPY; GRAIN SURFACE; NANOCRYSTALLINE DIAMOND; X-RAY LINE BROADENING;

DIAMOND FILMS;

EID: 34147101811     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.diamond.2006.12.026     Document Type: Article

References (12)

1. Abdulkhadar M., and Thomas B. Nanostruct. Mater. 10 (1998) 593
2. Bataineh M.M., and Reinhard D.K. Diamond Relat. Mater. 6 (1997) 1689
3. Bataineh M.M., Khatami S., Reinhard D.K., and Asmussen J. Proc. IEEE Southeast Conf. (2002) 33
4. Ye H., Jackman R.B., and Hing P. J. Appl. Phys. 94 (2003) 7878
5. Lunkenheimer P., Loidl A., Ottermann C.R., and Bange K. Phys. Rev., B 44 (1991) 5927
6. Dikonimos Th., Giorgi R., Lisi N., Pilloni L., and Salernitano E. Diamond Relat. Mater. 14/3-7 (2005) 318
7. Dikonimos Makris Th., Falconieri M., Gianoglio S., Giorgi L., Giorgi R., Lisi N., and Salernitano E. Advances in Science and Technology 48 (2006) 44
8. Jonscher K. Dielectric Relaxation in Solids (1983), Chelsea Dielectric, London
9. He D., Shao L., Gong W., Xie E., Xu K., and Chen G. Diamond Relat. Mater. 9 (2000) 1600
10. Robertson J. Adv. Phys. 35 (1986) 317
11. Xin H.W., Zhang Z.M., Ling X., Xi Z.L., Shen H.S., Dai Y.B., and Wan Y.Z. Diamond Relat. Mater 11 (2002) 228
12. Seto J.Y.W. J. Appl. Phys. 46 (1975) 5247