A ground truth correspondence measure for benchmarking

Proceedings - International Conference on Pattern Recognition

Volumn 3, Issue , 2006, Pages 568-573

  Karlsson, Johan ^a   Ericsson, Anders ^a  

^a LUND UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

MINIMUM DESCRIPTION LENGTH (MDL); STATISTICAL SHAPE MODELS;

ALGORITHMS; COMPUTATIONAL GEOMETRY; COMPUTATIONAL METHODS; FEATURE EXTRACTION; STATISTICAL METHODS;

BENCHMARKING;

EID: 34147101729     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICPR.2006.76     Document Type: Conference Paper

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