Effects of sulphate, nitrate and phosphate on pit initiation of pure aluminium in HCl-based solution

Corrosion Science

Volumn 49, Issue 6, 2007, Pages 2663-2675

  Na, Kyung Hwan ^a   Pyun, Su Il ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

A. Aluminium; A. Nitrate; A. Phosphate; A. Sulphate; B. Electrochemical noise

Indexed keywords

ALUMINUM; CONCENTRATION (PROCESS); HYDROCHLORIC ACID; NEGATIVE IONS; NITRATES; PHOSPHATES;

ELECTROCHEMICAL NOISE; PHOSPHATE IONS; STOCHASTIC THEORY;

PITTING;

ALUMINUM; CONCENTRATION (PROCESS); HYDROCHLORIC ACID; NEGATIVE IONS; NITRATES; PHOSPHATES; PITTING;

EID: 34047248042     PISSN: 0010938X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.corsci.2006.12.012     Document Type: Article

References (25)

1. Sastri V.S. Corrosion Inhibitors (1998), John Wiley & Sons, New York p. 737
2. Wernick S., Pinner P., and Sheasby P.G. The Surface Treatment and Finishing of Aluminium and Its Alloys (1987), ASM international, Metals Park p. 190
3. Zhao T., and Mu G. Corros. Sci. 41 (1999) 1937-1944
4. Grubač Z., Babić R., and Metikoš-Huković M. J. Appl. Electrochem. 32 (2002) 431-438
5. Branzoi V., Golgovici F., and Branzoi F. Mater. Chem. Phys. 78 (2003) 122-131
6. Bereket G., Pnarbas A., and Ogretir C. Anti-Corros. Method Mater. 51 (2004) 282-293
7. Abdallah M. Corros. Sci. 46 (2004) 1981-1996
8. Flis J., and Kowalczyk L. J. Appl. Electrochem. 25 (1995) 501-507
9. Rudd W.J., and Scully J.C. Corros. Sci. 20 (1980) 611-631
10. Pyun S.-I., and Moon S.-M. J. Solid State Electrochem. 3 (1999) 331-336
11. Lee W.-J., and Pyun S.-I. Electrochim. Acta 45 (2000) 1901-1910
12. Stewart J., Wells D.B., Scott P.M., and Williams D.E. Corros. Sci. 33 (1992) 73-88
13. Pistorius P.C. Corrosion 53 (1997) 273-283
14. Na K.-H., and Pyun S.-I. J. Electroanal. Chem. 596 (2006) 7-12
15. Na K.-H., Pyun S.-I., and Kim H.-P. Corros. Sci. 49 (2007) 220-230
16. Cottis R.A. Corrosion 57 (2001) 265-285
17. Al-Mazeedi H.A.A., and Cottis R.A. Electrochim. Acta 49 (2004) 2787-2793
18. Fothergill J.C. IEEE Trans. Electr. Insul. 25 (1990) 489-492
19. Homble P., and McCormick W.P. J. Appl. Probab. 32 (1995) 707-726
20. Nuzman C., Saniee I., Sweldens W., and Weiss A. Comput. Networks 40 (2002) 319-337
21. Lewis E.E. Introduction to Reliability Engineering (1987), John Wiley & Sons, New York p. 96
22. Pyun S.-I., and Lee E.-J. Surf. Coat. Technol. 62 (1993) 480-485
23. Pyun S.-I., Lee E.-J., and Han G.-S. Thin Solid Films 239 (1994) 74-78
24. Park J.-J., and Pyun S.-I. Corros. Sci. 46 (2004) 285-296
25. Sampathkumar B., Khachatourians G.G., and Korber D.R. Appl. Environ. Microbiol. 69 (2003) 122-129