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Volumn 111, Issue 10, 2007, Pages 1852-1859

Kinetics of sulfur oxide, sulfur fluoride, and sulfur oxyfluoride anions with atomic species at 298 and 500 K

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVE DISCHARGE; SELECTED-ION FLOW TUBE (SIFT); SULFUR OXIDE; SULFUR OXYFLUORIDE ANIONS;

EID: 34047217863     PISSN: 10895639     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp066198c     Document Type: Article
Times cited : (9)

References (68)
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    • (2005) NIST Chemistry WebBook, NIST Standard Reference Database No. 69
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    • Frisch, M. J, Trucks, G. W, Schlegel, H. B, Scuseria, G. E, Robb, M. A, Cheeseman, J. R, Montgomery, J. A, Jr, Vreven, T, Kudin, K N, Burant, J. C, Millam, J. M, Iyengar, S. S, Tomasi, J, Barone, V. Mennucci, B, Cossi, M, Scalmani, G, Rega, N, Petersson, G. A. Nakatsuji, H, Hada, M, Ehara, M, Toyota, K, Fukuda, R, Hasegawa, J. Ishida, M, Nakajima, T, Honda, Y, Kitao, O, Nakai, H, Kiene, M, Li X, Knox, J. E, Hratchian, H. P, Cross, J. B, Adamo, C, Jaramillo, J. Gomperts, R, Stratmann, R. E, Yazyev, O, Austin, A. J, Cammi, R. Pomelli, C, Ochterski, J. W, Ayala, P. Y, Morokuma, K, Voth, G. A. Salvador, P, Dannenberg, J. J, Zakrzewski, V. G, Dapprich, S, Daniels A. D, Strain, M. C, Farkas, O, Malick, D. K, Rabuck, A. D. Raghavachari, K, Foresman, J. B, Ortiz, J. V, Cui, Q, Baboul, A. G. Clifford, S, Cioslowski, J, Stefanov, B. B, Liu, G, Liashenko, A, Piskorz P, Komaromi, I, Martin, R. L, Fox, D. J, Keith, T, Al-Laham, M. A. P
    • Frisch, M. J.; Trucks, G. W.; Schlegel, H. B.; Scuseria, G. E.; Robb, M. A.; Cheeseman, J. R.; Montgomery, J. A., Jr.; Vreven, T.; Kudin, K N.; Burant, J. C.; Millam, J. M.; Iyengar, S. S.; Tomasi, J.; Barone, V. Mennucci, B.; Cossi, M.; Scalmani, G.; Rega, N.; Petersson, G. A. Nakatsuji, H.; Hada, M.; Ehara, M.; Toyota, K.; Fukuda, R.; Hasegawa, J. Ishida, M.; Nakajima, T.; Honda, Y.; Kitao, O.; Nakai, H.; Kiene, M.; Li X.; Knox, J. E.; Hratchian, H. P.; Cross, J. B.; Adamo, C.; Jaramillo, J. Gomperts, R.; Stratmann, R. E.; Yazyev, O.; Austin, A. J.; Cammi, R. Pomelli, C.; Ochterski, J. W.; Ayala, P. Y.; Morokuma, K.; Voth, G. A. Salvador, P.; Dannenberg, J. J.; Zakrzewski, V. G.; Dapprich, S.; Daniels A. D.; Strain, M. C.; Farkas, O.; Malick, D. K.; Rabuck, A. D. Raghavachari, K.; Foresman, J. B.; Ortiz, J. V.; Cui, Q.; Baboul, A. G. Clifford, S.; Cioslowski, J.; Stefanov, B. B.; Liu, G.; Liashenko, A.; Piskorz P.; Komaromi, I.; Martin, R. L.; Fox, D. J.; Keith, T.; Al-Laham, M. A. Peng, C. Y.; Nanayakkara, A.; Challacombe, M.; Gill, P. M. W.; Johnson, B.; Chen, W.; Wong, M. W.; Gonzalez, C.; Pople, J. A., Gaussian 03W, revision C.02; Gaussian, Inc.: Pittsburgh PA, 2003.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.