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Volumn 393, Issue 1-2, 2007, Pages 249-254

Determination of CdIn2S4 semiconductor parameters by (photo)electrochemical technique

Author keywords

CdIn2S4 thin films; EDAX; Mott Schottky plot; PEC; SEM; Spray pyrolysis; XRD

Indexed keywords

ELECTROLYTES; ENERGY DISPERSIVE SPECTROSCOPY; GLASS; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X RAY DIFFRACTION;

EID: 34047168432     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2007.01.009     Document Type: Article
Times cited : (44)

References (21)
  • 17
    • 34047110942 scopus 로고    scopus 로고
    • JCPDS diffraction data, file No's. 31-229 and 27-60.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.