Monte Carlo simulator and ancillary response generator of suzaku XRT/XIS system for spatially extended source analysis

Publications of the Astronomical Society of Japan

Volumn 59, Issue 1 SPEC. ISS., 2007, Pages

  Ishisaki, Yoshitaka ^a   Maeda, Yoshitomo ^b   Fujimoto, Ryuichi ^b   Ozaki, Masanobu ^b   Ebisawa, Ken ^b   Takahashi, Tadayuki ^b   Ueda, Yoshihiro ^c   Ogasaka, Yasushi ^d   Ptak, Andrew ^e   Mukai, Koji ^f,g   Hamaguchi, Kenji ^f,g   Hirayama, Masaharu ^f,h   Kotani, Taro ⁱ   Kubo, Hidetoshi ^c   Shibata, Ryo ^c   Ebara, Masatoshi ^b   Furuzawa, Akihiro ^d   Iizuka, Ryo ^j   Inoue, Hirohiko ^b   Mori, Hideyuki ^c   Okada, Shunsaku ^b   Yokoyama, Yushi ^b   Matsumoto, Hironori ^c   Nakajima, Hiroshi ^c   Yamaguchi, Hiroya ^c   Anabuki, Naohisa ^k   Tawa, Noriaki ^k   Nagai, Masaaki ^k   Katsuda, Satoru ^k   Hayashida, Kiyoshi ^k   Bamba, Aya ^l   Miller, Eric D ^m   Sato, Kosuke ^a   Yamasaki, Noriko Y ^b   more..

^a TOKYO METROPOLITAN UNIVERSITY   (Japan)

^b JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

^c KYOTO UNIVERSITY   (Japan)

^d NAGOYA UNIVERSITY   (Japan)

^e JOHNS HOPKINS UNIVERSITY   (United States)

^f NASA GODDARD SPACE FLIGHT CENTER   (United States)

^g UNIVERSITIES SPACE RESEARCH ASSOCIATION   (United States)

^h UNIVERSITY OF MARYLAND BALTIMORE COUNTY   (United States)

ⁱ TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^j Nishi Harima Astronomical Observatory   (Japan)

^k OSAKA UNIVERSITY   (Japan)

^l INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^m MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

more..

Author keywords

Instrumentation: detectors; Methods: data analysis; Telescopes; X rays: general

Indexed keywords

CALIBRATION; DATA HANDLING; INFORMATION ANALYSIS; INTELLIGENT SYSTEMS; PHOTONS; PRISMS; SPECTROMETERS; TELESCOPES;

EXTENDED SOURCES; INSTRUMENTATION:DETECTORS; METHODS. DATA ANALYSIS; MONTE CARLO SIMULATORS; MONTE CARLO'S SIMULATION; OPTICAL BLOCKING FILTERS; SOURCE ANALYSIS; X RAY TELESCOPE; X-RAY GENERAL; X-RAY IMAGING SPECTROMETERS;

MONTE CARLO METHODS;

EID: 34047106130     PISSN: 00046264     EISSN: None     Source Type: Journal    
DOI: 10.1093/pasj/59.sp1.s113     Document Type: Article

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