Shear-band propagation in fully amorphous and partially crystallized Mg-based alloys studied by nanoindentation and transmission electron microscopy

Journal of Alloys and Compounds

Volumn 434-435, Issue SPEC. ISS., 2007, Pages 48-51

  Castellero, A ^a,b   Lloyd, S J ^a   Madge, S V ^a,c   Kovacs, Zs ^d   Loffler J F ^b   Baricco, M ^e   Greer, A L ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b ETH ZURICH   (Switzerland)

^c INTERNATIONAL ADVANCED RESEARCH CENTRE FOR POWDER METALLURGY AND NEW MATERIALS ARCI   (India)

^d EÖTVÖS LORÁND UNIVERSITY   (Hungary)

^e UNIVERSITY OF TURIN   (Italy)

Author keywords

Focused ion beam; Metallic glass; Nanoindentation; Shear band; TEM

Indexed keywords

FOCUSED ION BEAMS; MAGNESIUM ALLOYS; METALLIC GLASS; NANOINDENTATION; SHEAR BANDS; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTAL SIZE; CRYSTALLIZED FRACTION; INDENTER TIPS;

AMORPHOUS ALLOYS;

EID: 33947731846     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2006.08.168     Document Type: Article

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