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Volumn 27, Issue 8-9 SPEC. ISS., 2007, Pages 2995-2999
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Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg1/3Ta2/3)O3
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Author keywords
Extended X ray absorption fine structure (EXAFS)
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Indexed keywords
DOPING (ADDITIVES);
EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;
LATTICE CONSTANTS;
NICKEL;
PERMITTIVITY;
X RAY DIFFRACTION ANALYSIS;
MICROWAVE DIELECTRIC CONSTANT;
MICROWAVE PROPERTIES;
NICKEL DOPING;
RAMAN ANALYSIS;
CERMETS;
CERMETS;
DOPING (ADDITIVES);
EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;
LATTICE CONSTANTS;
NICKEL;
PERMITTIVITY;
X RAY DIFFRACTION ANALYSIS;
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EID: 33947710798
PISSN: 09552219
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jeurceramsoc.2006.11.025 Document Type: Article |
Times cited : (5)
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References (23)
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