Characterizing xBa (Mg1/3Ta2/3)O3+ (1-x) Ba (Mg1/3Nb2/3)O3 microwave ceramics using extended x-ray absorption fine structure method

Applied Physics Letters

Volumn 88, Issue 24, 2006, Pages

  Chang, P J ^a   Chia, C T ^a   Lin, I N ^b   Lee, J F ^c   Lin, C M ^d   Wu, K T ^e  

^a NATIONAL TAIWAN NORMAL UNIVERSITY   (Taiwan)

^b TAMKANG UNIVERSITY   (Taiwan)

^c NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^d NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^e SOOCHOW UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISTORTION; MICROWAVE DEVICES; NIOBIUM COMPOUNDS; TANTALUM COMPOUNDS; X RAY ANALYSIS;

MICROWAVE CERAMICS; MICROWAVE DIELECTRIC CONSTANT; OXYGEN OCTAHEDRON; X-RAY ABSORPTION;

CERAMIC MATERIALS;

EID: 33745203505     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2213514     Document Type: Article

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