Analysis of roughness of Cs surfaces via evaluation of the autocorrelation function

Surface Science

Volumn 601, Issue 7, 2007, Pages 1684-1692

  Fubel, A ^a   Zech, M ^a   Leiderer, P ^a   Klier, J ^a   Shikin, V ^b  

^a UNIVERSITY OF KONSTANZ   (Germany)

^b INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

Author keywords

Alkali metals; Computer simulations; Metallic films; Polycrystalline surfaces; Polycrystalline thin films; Scanning tunneling microscopy; Surface diffusion; Surface roughening; Surface structure, morphology, roughness, and topography

Indexed keywords

AUTOCORRELATION; COMPUTER SIMULATION; LOW TEMPERATURE OPERATIONS; METALLIC FILMS; QUENCHING; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SURFACE DIFFUSION; SURFACE MORPHOLOGY; SURFACE ROUGHNESS;

POLYCRYSTALLINE SURFACES; POLYCRYSTALLINE THIN FILMS; SURFACE ROUGHENING;

CESIUM;

EID: 33947698453     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.01.040     Document Type: Article

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