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Volumn 942, Issue , 2006, Pages 45-51

On the structural and optical properties of ZnO nanoparticles formed in silica by ion implantation

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ION IMPLANTATION; NANOPARTICLES; OPTICAL PROPERTIES; SILICA; THERMOOXIDATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 33947689282     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-0942-w08-36     Document Type: Conference Paper
Times cited : (1)

References (12)
  • 6
    • 0002590118 scopus 로고
    • Semiconductors: Physics of II-VI and I-VII Compounds, Semimagnetic Semiconductors
    • ed. O. Madelung, M. Schulz, and H. Weiss Springer, Berlin
    • E. Mollwo, "Semiconductors: Physics of II-VI and I-VII Compounds, Semimagnetic Semiconductors", "Landolt-Börnstein New Series", ed. O. Madelung, M. Schulz, and H. Weiss (Springer, Berlin, 1982), Vol. 17, p.35.
    • (1982) Landolt-Börnstein New Series , vol.17 , pp. 35
    • Mollwo, E.1
  • 11
    • 33947646447 scopus 로고    scopus 로고
    • X-ray Powder Diffraction Analysis of Real Structure of Matter, ed. H.-J. Bunge, J. Fiala & R.L. Snyder (IuCr/Oxford University Press, 1999).
    • "X-ray Powder Diffraction Analysis of Real Structure of Matter", ed. H.-J. Bunge, J. Fiala & R.L. Snyder (IuCr/Oxford University Press, 1999).
  • 12
    • 33947657461 scopus 로고    scopus 로고
    • The Rietveld Method, ed. R.A. Young (IuCr/Oxford University Press, 1993).
    • "The Rietveld Method", ed. R.A. Young (IuCr/Oxford University Press, 1993).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.