Size-related plasticity effects in AFM silicon cantilever tips

Materials Research Society Symposium Proceedings

Volumn 924, Issue , 2006, Pages 19-24

  Kopycinska Mueller, Malgorzata ^a   Geiss, Roy H ^a   Hurley, Donna C ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC CONSTANTS; NANOTIPS; NATURAL FREQUENCIES; NICKEL; PLASTICITY; SILICON;

ATOMIC FORCE ACOUSTIC MICROSCOPY (AFAM); SILICON PROBES; STATIC LOADS;

ATOMIC FORCE MICROSCOPY;

EID: 33947677529     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-0924-z03-02     Document Type: Conference Paper

References (10)

1. K. Yamanaka, A. Noguchi, T. Tsuji, T. Koike, and T. Goto, Surf. Inter. Anal. 27, 600 (1999).
2. M. T. Cuberes, H. E. Assender, G. A. D. Briggs, and O. L. Kolosov, J. Phys. D: Appl. Phys. 33, 2347 (2000).
3. U. Rabe et al., Ultrasonics 38, 430 (2000).
4. K. L. Johnson, Contact Mechanics (Cambridge University Press, Cambridge UK, 1985) p. 92.
5. A. L. Ruoff, J. Appl. Phys. 50, 3354 (1979).
6. M. Kopycinska-Müller, R. H. Geiss, and D. C. Hurley, Ultramicroscopy 2006, in print.
7. G. Simmons and H. Wang, Single crystal elastic constants and calculated aggregate properties: A handbook (The MIT Press, Cambridge, MA, 1971) p.56.
8. W. W. Gerberich et al., J. Mech. Phys. Solids 51, 979 (2003).
9. J. R. Greer, W. C. Oliver, and W. D, Nix, Acta Mater. 53, 1821 (2005).
10. Y. Zhou, U. Erb, K. T. Aust, and G. Palumbo, Scripta Mater. 48, 825 (2003).