Analysis of surface degradation of epoxy nanocomposite due to tracking under AC and DC voltages

Polymer Degradation and Stability

Volumn 92, Issue 4, 2007, Pages 560-568

  Sarathi, R ^a   Rajesh Kumar, P ^a   Sahu, R K ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

Degradation; Epoxy resin; Insulation; Leakage current; Nanocomposites; Tracking

Indexed keywords

DEGRADATION; ELECTRIC POTENTIAL; EPOXY RESINS; LEAKAGE CURRENTS;

DAMAGE GENERATING PROCESS; SPIN CONCENTRATION; TRACKING;

NANOCOMPOSITES;

EID: 33947675173     PISSN: 01413910     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymdegradstab.2007.01.014     Document Type: Article

References (20)

1. Kozako M., Fuse N., Ohki Y., Okamoto T., and Tanaka T. IEEE Transactions on Dielectrics and Electrical Insulation 11 5 (2004) 833-839
2. Tanaka T., Montanari G.C., and Mulhaupt R. IEEE Transactions on Dielectrics and Electrical Insulation 11 (2004) 763-784
3. Lan T., and Pinnavaia T.J. Chemistry of Materials 6 (1994) 2216-2219
4. Pinnavaia T.J., and Beall G.W. Polymer clay nanocomposites (2000), Wiley, New York (Wiley series in polymer science)
5. Messersmith P.B., and Giannelis E.P. Chemistry of Materials 6 (1994) 1719-1725
6. Alexandre M., and Dubois P. Materials Science and Engineering 28 (2000) 1-63
7. Zilg C., Mulhaupt R., and Finter J. Macromolecular Chemistry and Physics 200 (1999) 661-667
8. Gorur R.S., Cherney E.A., and Burnham J.T. Outdoor insulators (1999), Ravi S. Gorur, Inc., Phoenix, Arizona 85044, USA
9. Kumagai S., and Yoshimura N. IEEE Transactions on Dielectrics and Electrical Insulation 7 3 (2000) 423-431
10. IEC publication 60 587. Testing method for evaluating the resistance of tracking and erosion of electrical insulating materials used under severe ambient conditions, 1984.
11. Southern clay products., Inc, Technical data; 2006.
12. Lan T., Kaviratna P.D., and Pinnavaia T.J. Chemistry of Materials l-7 (1995) 2144-2150
13. Sarathi R., and Rao U.M. Journal of Applied Polymer Science 88 10 (2003) 2392-2399
14. Hepburn D.M., Kemp I.J., Shields A.J., and Copper J. IEE Proceedings - Science, Measurement and Technology 147 3 (2000) 97-104
15. Kauffman P. Trading systems and methods (1989), Wiley, New York
16. Crank J. Mathematics of diffusion. 2nd ed. (1975), Clarendon, Oxford
17. Camino G., Tartaglione G., Frache A., Manferti C., and Costa G. Polymer Degradation and stability 90 (2005) 354-362
18. Wang Xinmin, MacCrone RK, Nelson JK. Properties and applications of Proceedings, Second international conference on properties and applications of dielectric materials; 1988. pp. 315-318.
19. Roy M., Nelson J.K., MacCrone R.K., Schadler L.S., Reed C.W., and Keefe R. IEEE Transactions on Dielectrics and Electrical Insulation 12 4 (2005) 629-643
20. Wertz J.F., and Bolton J.R. Electron spin resonance: theory and applications (1986), McGraw-Hill, New York