Erratum to "New method of the precise measurement for the thickness and bulk etch rate of the solid-state track detector". [Nucl. Instr. and Meth. A 574 (2007) 163-170] (DOI:10.1016/j.nima.2007.01.086);New method of the precise measurement for the thickness and bulk etch rate of the solid-state track detector

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 574, Issue 1, 2007, Pages 163-170

  Kodaira, S ^a   Yasuda, N ^b   Hasebe, N ^a   Doke, T ^a   Ota, S ^a   Ogura, K ^c  

^a WASEDA UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF RADIOLOGICAL SCIENCES   (Japan)

^c NIHON UNIVERSITY   (Japan)

Author keywords

Amount of bulk etch; Charge resolution; CR 39; Galactic cosmic rays; Local thickness; Mass resolution; Solid state track detector; Track registration sensitivity; Trans iron nuclei

Indexed keywords

CHARGE DISTRIBUTION; COSMIC RAYS; ETCHING; PARTICLE BEAM TRACKING; THICKNESS MEASUREMENT;

AMOUNT OF BULK ETCHING; CHARGE RESOLUTION; GALACTIC COSMIC RAYS; LOCAL THICKNESS; MASS RESOLUTION; SOLID STATE TRACK DETECTORS; TRACK REGISTRATION SENSITIVITY; TRANS IRON NUCLEI;

RADIATION DETECTORS;

EID: 33947674333     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2008.05.053     Document Type: Erratum

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